Global Wafer Defect Bright and Dark Field Inspection Equipment Market Growth 2025-2031

The global Wafer Defect Bright and Dark Field Inspection Equipment market size is predicted to grow from US$ 6246 million in 2025 to US$ 10990 million in 2031; it is expected to grow at a CAGR of 9.9% from 2025 to 2031.

Wafer defect bright and dark field detection is based on optical imaging technology to detect patterned wafers. Bright field means that the angle of illumination light and the angle of collection light are completely or partially the same. The light reflected from the surface of the wafer is formed; while the dark field means that the angle of the illumination light and the angle of the collected light are completely different, so the final image formed on the photoelectric sensor is the 3D image of the illumination light incident on the wafer surface and the graphic surface. Structures are formed by light scattered back.

The global key manufacturers of Wafer Defect Bright and Dark Field Inspection Equipment include KLA Corporation, Applied Materials, ASML, Hitachi High-Tech Corporation, Onto Innovation, Camtek, Skyverse Technology, SCREEN Semiconductor Solutions, Lasertec, NEXTIN, etc. In 2023, the global top 10 players had a share approximately 92.0% in terms of revenue.

In Patterned Wafer Defect Inspection Systems segment are dominated by KLA and Applied Materials;

Unpatterned Wafer Inspection Systems are dominated by KLA and Hitachi High-Tech Corporation.

The global market for semiconductor was estimated at US$ 526.8 billion in the year 2023, is projected to US$ 780.7 billion by 2030. IC Manufacturing is the process used to manufacture semiconductor devices, typically integrated circuits (ICs) such as computer processors, microcontrollers, and memory chips (such as NAND flash and DRAM). According to our research, the global semiconductor manufacturing (wafer fabrication) market is projected to grow from US$ 251.7 billion in 2023 to US$ 506.5 billion by 2030, at a Compound Annual Growth Rate (CAGR) of 40.49% during the forecast period. This will drive rapid growth of global Wafer Defect Inspection System.

LP Information, Inc. (LPI) ' newest research report, the “Wafer Defect Bright and Dark Field Inspection Equipment Industry Forecast” looks at past sales and reviews total world Wafer Defect Bright and Dark Field Inspection Equipment sales in 2024, providing a comprehensive analysis by region and market sector of projected Wafer Defect Bright and Dark Field Inspection Equipment sales for 2025 through 2031. With Wafer Defect Bright and Dark Field Inspection Equipment sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in US$ millions of the world Wafer Defect Bright and Dark Field Inspection Equipment industry.

This Insight Report provides a comprehensive analysis of the global Wafer Defect Bright and Dark Field Inspection Equipment landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and M&A activity. This report also analyzes the strategies of leading global companies with a focus on Wafer Defect Bright and Dark Field Inspection Equipment portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms’ unique position in an accelerating global Wafer Defect Bright and Dark Field Inspection Equipment market.

This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for Wafer Defect Bright and Dark Field Inspection Equipment and breaks down the forecast by Type, by Application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global Wafer Defect Bright and Dark Field Inspection Equipment.

This report presents a comprehensive overview, market shares, and growth opportunities of Wafer Defect Bright and Dark Field Inspection Equipment market by product type, application, key manufacturers and key regions and countries.

Segmentation by Type:
Bright Field Patterned Wafer Defect Inspection
Dark Field Patterned Wafer Defect Inspection
Dark Field Non-patterned Wafer Defect Inspection

Segmentation by Application:
300mm Wafer Size
200mm Wafer Size
Others

This report also splits the market by region:
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries

The below companies that are profiled have been selected based on inputs gathered from primary experts and analysing the company's coverage, product portfolio, its market penetration.
KLA Corporation
Applied Materials
Lasertec
Hitachi High-Tech Corporation
ASML
Onto Innovation
Camtek
SCREEN Semiconductor Solutions
Skyverse Technology
Toray Engineering
NEXTIN
Suzhou TZTEK (Muetec)
Microtronic
Bruker
SMEE
Hangzhou Changchuan Technology
Wuhan Jingce Electronic Group
Angkun Vision (Beijing) Technology
Nanotronics
Visiontec Group
Hefei Yuwei Semiconductor Technology
Suzhou Secote (Optima)
DJEL
Jiangsu VPTEK
Shuztung Group
Confovis
Zhongdao Optoelectronic
Suzhou Xinshi Technology
RSIC scientific instrument (Shanghai)
Takano
Unity Semiconductor SAS

Key Questions Addressed in this Report

What is the 10-year outlook for the global Wafer Defect Bright and Dark Field Inspection Equipment market?

What factors are driving Wafer Defect Bright and Dark Field Inspection Equipment market growth, globally and by region?

Which technologies are poised for the fastest growth by market and region?

How do Wafer Defect Bright and Dark Field Inspection Equipment market opportunities vary by end market size?

How does Wafer Defect Bright and Dark Field Inspection Equipment break out by Type, by Application?

Please note: The report will take approximately 2 business days to prepare and deliver.