Global Semiconductor Critical Dimension (CD) Metrology Systems Market Growth 2025-2031

The global Semiconductor Critical Dimension (CD) Metrology Systems market size is predicted to grow from US$ million in 2025 to US$ million in 2031; it is expected to grow at a CAGR of %from 2025 to 2031.

Semiconductor Critical Dimension (CD) Metrology Systems are specialized instruments used in the semiconductor manufacturing industry for measuring and characterizing critical dimensions on semiconductor wafers and devices. Critical dimensions refer to specific, precise measurements of features, patterns, or structures on semiconductor wafers, which are crucial for ensuring the functionality and performance of integrated circuits (ICs) and other semiconductor components. These metrology systems provide accurate and high-resolution measurements, contributing to quality control and process optimization in semiconductor fabrication.

According to the SEMI, global sales of semiconductor equipment was US$ 109 billion in 2022, a year-on-year increase of 5.6%. Mainland China is the largest semiconductor equipment market in the world. For the third consecutive year, China remained the largest semiconductor equipment market in 2022 despite a 5% slowdown in the pace of investments in the region year over year, accounting for $28.3 billion in billings. China Taiwan, the second-largest destination for equipment spending, recorded an increase of 8% to $26.8 billion, marking the fourth straight year of growth for the region. Equipment sales to Korea contracted 14% to $21.5 billion. Annual semiconductor equipment investments in Europe surged 93%, while North America logged a 38% increase. Sales to the Rest of World and Japan increased 34% and 7% year over year, respectively.

LP Information, Inc. (LPI) ' newest research report, the “Semiconductor Critical Dimension (CD) Metrology Systems Industry Forecast” looks at past sales and reviews total world Semiconductor Critical Dimension (CD) Metrology Systems sales in 2024, providing a comprehensive analysis by region and market sector of projected Semiconductor Critical Dimension (CD) Metrology Systems sales for 2025 through 2031. With Semiconductor Critical Dimension (CD) Metrology Systems sales broken down by region, market sector and sub-sector, this report provides a detailed analysis in US$ millions of the world Semiconductor Critical Dimension (CD) Metrology Systems industry.

This Insight Report provides a comprehensive analysis of the global Semiconductor Critical Dimension (CD) Metrology Systems landscape and highlights key trends related to product segmentation, company formation, revenue, and market share, latest development, and M&A activity. This report also analyzes the strategies of leading global companies with a focus on Semiconductor Critical Dimension (CD) Metrology Systems portfolios and capabilities, market entry strategies, market positions, and geographic footprints, to better understand these firms’ unique position in an accelerating global Semiconductor Critical Dimension (CD) Metrology Systems market.

This Insight Report evaluates the key market trends, drivers, and affecting factors shaping the global outlook for Semiconductor Critical Dimension (CD) Metrology Systems and breaks down the forecast by Type, by Application, geography, and market size to highlight emerging pockets of opportunity. With a transparent methodology based on hundreds of bottom-up qualitative and quantitative market inputs, this study forecast offers a highly nuanced view of the current state and future trajectory in the global Semiconductor Critical Dimension (CD) Metrology Systems.

This report presents a comprehensive overview, market shares, and growth opportunities of Semiconductor Critical Dimension (CD) Metrology Systems market by product type, application, key manufacturers and key regions and countries.

Segmentation by Type:
Optical Critical Dimension
CD-SEM

Segmentation by Application:
8 Inch Wafer
12-Inch Wafer
Others

This report also splits the market by region:
Americas
United States
Canada
Mexico
Brazil
APAC
China
Japan
Korea
Southeast Asia
India
Australia
Europe
Germany
France
UK
Italy
Russia
Middle East & Africa
Egypt
South Africa
Israel
Turkey
GCC Countries

The below companies that are profiled have been selected based on inputs gathered from primary experts and analysing the company's coverage, product portfolio, its market penetration.
KLA Corporation
Applied Materials
Hitachi High-Tech
NanoSystem Solutions
Onto Innovation
Camtek
Park System
ASML
ZEISS
Muetec
UnitySC
RSIC scientific instrument
Wuhan Jingce Electronic Group
Shenzhen Nanolighting Technology
Dongfang Jingyuan Electron
Suzhou Secote Precision Electronic
Shenzhen Angstrom Excellence Technology

Key Questions Addressed in this Report

What is the 10-year outlook for the global Semiconductor Critical Dimension (CD) Metrology Systems market?

What factors are driving Semiconductor Critical Dimension (CD) Metrology Systems market growth, globally and by region?

Which technologies are poised for the fastest growth by market and region?

How do Semiconductor Critical Dimension (CD) Metrology Systems market opportunities vary by end market size?

How does Semiconductor Critical Dimension (CD) Metrology Systems break out by Type, by Application?

Please note: The report will take approximately 2 business days to prepare and deliver.