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Global Thin Film Metrology Systems Market 2015-2019

  • Executive Summary
  • List of Abbreviations
  • Scope of the Report
    • Market Overview
    • Product Offerings
  • Market Research Methodology
    • Market Research Process
    • Research Methodology
      • Table Market Research Methodology
  • Introduction
    • Table Semiconductor Value Chain
  • Market Landscape
    • Market Size and Forecast
      • Table Global Thin Film Metrology Systems Market (US$ million)
    • Five Forces Analysis
  • Geographical Segmentation
    • Global Thin Film Metrology Systems Market by Geographical Segmentation
      • Table Global Thin Film Metrology Systems Market by Geography 2014-2019 (CAGR)
      • Table Global Thin Film Metrology Systems Market by Geography 2014-2019
      • Table Global Thin Film Metrology Systems Market by Geography 2014-2019 (US$ million)
  • Buying Criteria
  • Market Growth Drivers
  • Drivers and their Impact
  • Market Challenges
  • Impact of Drivers and Challenges
  • Market Trends
  • Trends and their Impact
  • Vendor Landscape
    • Competitive Scenario
    • Market Share Analysis 2014
      • Table Global Thin Film Metrology Systems Market by Vendor Segmentation 2014
    • Other Prominent Vendors
      • Hitachi High-Technologies
      • SCREEN Holdings
      • Semilab
  • Key Vendor Analysis
    • KLA-Tencor
      • Key Facts
      • Business Overview
      • Product Segmentation
        • Table KLA-Tencor: Product Segmentation
      • Services Offered
        • Table KLA-Tencor: Services Offered
      • Geographical Segmentation by Revenue 2014
        • Table KLA-Tencor: Geographical Segmentation by Revenue 2014
      • SWOT Analysis
    • Nanometrics
      • Key Facts
      • Business Overview
      • Business Segmentation by Revenue 2013
        • Table Nanometrics: Business Segmentation by Revenue 2013
      • Business Segmentation by Revenue 2012 and 2013
        • Table Nanometrics: Business Segmentation by Revenue 2012 and 2013 (US$ billion)
      • Geographical Segmentation by Revenue 2013
        • Table Nanometrics: Geographical Segmentation by Revenue 2013
      • Business Strategy
      • Recent Developments
      • SWOT Analysis
    • Nova Measuring Instruments
      • Key Facts
      • Business Overview
      • Product Segmentation
        • Table Nova Measuring Instruments: Product Segmentation 2013
      • Geographical Segmentation by Revenue 2013
        • Table Nova Measuring Instruments: Geographical Segmentation by Revenue 2013
      • Business Strategy
      • Key Developments
      • SWOT Analysis
    • Rudolph Technologies
      • Key Facts
      • Business Overview
      • Business Segmentation by Revenue 2013
        • Table Rudolph Technologies: Business Segmentation by Revenue 2013
      • Business Segmentation by Revenue 2012 and 2013
        • Table Rudolph Technologies: Business Segmentation by Revenue 2012 and 2013(US$ million)
      • Geographical Segmentation by Revenue 2013
        • Table Rudolph Technologies: Geographical Segmentation by Revenue 2013
      • Business Strategy
      • Recent Developments
      • SWOT Analysis
  • Other Reports in this Series

Global Thin Film Metrology Systems Market 2015-2019

About Thin-film Metrology Systems

Thin film metrology systems are used to measure the film thickness accurately. A series of film layers that act as a conductors, semiconductors, or bare wafers are deposited on an IC during IC fabrication. Thin film metrology systems are required during thin film deposition process to monitor and measure thin film parameters such as thickness, resistivity, and stress. There are various technologies used to measure the film thickness which include profilometry, ellipsometry, spectroscopic reflectrometry, and X-ray analysis.

TechNavio's analysts forecast the Global Thin-film Metrology Systems market will grow at a CAGR of 3.4 percent over the period 2014-2019.

Covered in this Report

This report covers the present scenario and growth prospects of the Global Thin Film Metrology Systems market for the period 2015-2019. It considers 2014 as the base year and provides data for the trailing 12 months. To calculate the market size, the report considers revenue generated from the sales of thin film metrology systems to various end-users including:

  • ODMs
  • OEMs
  • Foundries
Key Regions
  • Americas
  • APAC
  • EMEA
Key Vendors
  • KLA-Tencor
  • Nanometrics
  • Nova Measuring Instruments
  • Rudolph Technologies
Other Prominent Vendors
  • Hitachi High-Technologies
  • SCREEN Holdings
  • Semilab
Key Market Driver
  • Increased Level of Complexity in ICs
  • For a full, detailed list, view our report
Key Market Challenge
  • Cyclic Nature of Semiconductor Industry
  • For a full, detailed list, view our report
Key Market Trend
  • Increasing Demand for Integration and Miniaturization of Semiconductor Devices
  • For a full, detailed list, view our report
Key Questions Answered in this Report
  • What will the market size be in 2019 and what will the growth rate be?
  • What are the key market trends?
  • What is driving this market?
  • What are the challenges to market growth?
  • Who are the key vendors in this market space?
  • What are the market opportunities and threats faced by the key vendors?
  • What are the strengths and weaknesses of the key vendors?


Press Release

TechNavio Announces the Publication of its Research Report – Global Thin Film Metrology Systems Market 2015-2019

TechNavio recognizes the following companies as the key players in the Global Thin Film Metrology Systems Market: KLA-Tencor Corp., Nanometrics Inc., Nova Measuring Instruments Ltd. and Rudolph Technologies Inc

Other Prominent Vendors in the market are: Hitachi High-Technologies, SCREEN Holdings and Semilab.

Commenting on the report, an analyst from TechNavio’s team said: “One of the major trends in the market is the increase in demand for integration and miniaturization of semiconductor devices. High level of integration to add functionalities on a single device is leading to the miniaturization of ICs which is accelerating the demand for thin film metrology systems to effectively enable a semiconductor manufacturing process.”

According to the report, one of the main drivers of the market is the increased level of complexity in ICs. Over the years, the number of functions an IC has been able to do has increased considerably, resulting in the introduction of complex architectures such as 3D and FinFET. This is expected to foster the demand for thin film metrology systems as they are used in the manufacturing of complex semiconductor ICs.

Further, the report states that the cyclical nature of the semiconductor industry is one of the main challenges in the market. The revenue generated in the Semiconductor industry is cyclical in nature which acts as a major challenge for thin film metrology systems as they are dependent on the economic condition and the capital expenditure cycle of semiconductor manufacturers. Often production tends to exceed the demand during economic downturn, resulting in inventory pileup and, thus, low demand for semiconductor devices.

Companies Mentioned

KLA-Tencor , Nanometrics , Nova Measuring Instruments , Rudolph Technologies , Hitachi High-Technologies, SCREEN Holdings, Semilab

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