Emerging Trends in Semiconductor Testing and Semiconductor ATE - Technical Insights

Published by: Frost & Sullivan

Published: Jun. 14, 2006

Table of Contents

1. Executive Summary

1. Scope and Research Methodology

1. Scope

2. Research Methodology

2. Introduction and Key Findings

1. Introduction

2. Key Findings

2. Trends in Semiconductor Testing Technology

1. Role of Testing in IC Chip Production Flow

1. Typical Production Flow

2. Engineering and Manufacturing Testing

2. Market and Technology Trends

1. Suppressing Test Cost

2. Increased On-Chip Testing

3. Rise of Open Architecture

4. Modular Systems

5. Testing in Parallel

3. Prominent Emerging Technologies

1. ATE and DFT Technologies

1. 6.5 Gbps Open Architecture ATE Solution

2. ATE Industry's First Universal Slot Open Architecture Solution

3. ATE with Advanced IC Reliability Testing Features

4. Fully Automated On-Wafer RF Testing

5. New ATE Solution with 12.8 Gbps Bit Rate

6. Calibration using Robotic Control

7. X-Compact:A Compaction Technique for Increasing Semiconductor Chip Testing Requirements

8. X-PAND: An Efficient Test Stimulus Compression Technique

9. DFT Analyzer Validates DFT Features before Prototyping

10. DFT Technology That Cuts ATE Overheads

11. Fully Integrated Embedded Test and Diagnostic Solution for 90 nm and Beyond

12. Next Generation 1-Pass Test Synthesis

2. Testing Diagnostic Tools and Software

1. Embedded SerDes Test (EST) High-Speed I/O Test Technology

2. Extremely Low Inductance Power Transmission Module for At-Speed Testing of SOCs

3. Industry's Fastest and Most Cost-Effective SMU Line

4. Zero-Defectivity Capable In-line Data Analysis Solution for Semiconductor Production Test

5. Towards Zero Defectivity in Semiconductor Chips

3. Noteworthy Future Technologies

1. New IEEE Standard for Testing Carbon Nanotube

2. Wireless Test Access Mechanism for Future SOC Chips

3. Computational Intelligence-Based Testing for Semiconductor Measurement Systems

4. Adoption Factors and Forecasts

1. Adoption Factors

1. Technology and Market Drivers

2. Restraints

3. Challenges

2. Forecasts

1. Struggles in Open Architecture Systems

2. Computational Intelligence ATE System

3. High-end Testers

4. Zero Defects Initiative (FlexRay and PAT)

5. Key Contacts and Selected Patents

1. Key Contacts

1. Corporate

2. Universities/Research Institutes

2. Selected Patents and Glossary

1. List of Recent Patents-I

2. List of Recent Patents-II

3. Glossary of Terms used in Semiconductor Testing

6. Frost & Sullivan 2006 Technology Awards

1. Excellence in Technology Award-I

1. Award Description

2. Award Recipient

2. Excellence in Technology Award-II

1. Award Description

2. Award Recipient

3. Product Innovation Award

1. Award Description

2. Award Recipient

7. Decision Support Databases

1. Semiconductor End-Product Market Statistics

1. Business PCs Installed Bases in North America from 1999 to 2009

2. Business PCs per Entreprise in North America from 1999 to 2009

3. Camcorder Units Sales in United States from 1999 to 2009

4. Digital Camera Units Sales in North America from 1999 to 2009

5. Global PCs Installed Bases for the Period of 1996 to 2004

6. Global Handsets Installed Bases from 1996 to 2004

7. Global Handsets Sales from 1996 to 2004

8. Home PCs per Household in North America From 1999 to 2009

9. Number of Telemuters in North America from 1999 to 2009

10. Total PDA Units Sales in United States from 1999 to 2009

11. Total Protable PCs Installed Bases Worldwide from 1996 to 2004

12. Global TV Installed Bases from 1996 to 2004

2. Semiconductor Industry Statistics

1. Global Semiconductor & Semiconductor Equipment Market Value from 1999 to 2006.

2. Number of Semiconductor Plants in United States from 1988 to 2001

3. Global Semiconductor & Semiconductor Equipment Market Value from 1996 to 2006

4. Global Printed Circuit Board Sales from 1998 to 2004

Abstract

This research service provides analyses of open architecture ATE, computational intelligence ATE, DFT, zero defectivity initiative technologies along with key drivers, challenges, restraints, analysis, and forecasts of the technologies. In this research, Frost & Sullivan's expert analysts thoroughly examine the technologies of semiconductor testing and semiconductor ATE.

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