Read Architectures for Multi-bit per cell NAND Flash Memories
Forward Insights
September 1, 2009 36 Pages - SKU: GCWF2422391
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| This report explores the theory, circuit elements, timings, and key design features of the conventional interleaved architecture versus the all bitline sensing architecture.
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- Contents
- CONTENTS
- LIST OF FIGURES
- EXECUTIVE SUMMARY
- INTRODUCTION
- NAND FLASH READ ARCHITECTURES
- Conventional Read Architecture
- Latch design
- All Bitline Sensing (ABL) Architecture
- Sensing Design
- ABL Sensing vs. Conventional Read
- Summary
- REFERENCES
- ABOUT THE AUTHOR
- ABOUT FORWARD INSIGHTS
- Services
- Contact
- REPORT OFFERINGS
- List of Figures
- Figure 1. NAND Architecture
- Figure 3. Conventional Read: Essential Elements of the Page Buffer
- Figure 4. Conventional Read Timing
- Figure 5. Conventional Read Latches
- Figure 6. Conventional Read: Latch characteristic for appropriate sizing
- Figure 7. ABL sensing: Essential Elements of the Page Buffer
- Figure 9. ABL sensing: the sense
- Figure 10 Evaluation Time
- Figure 11. Contributors to Parasitic Capacitance (Bitline cross-section)
- Figure 12 Three adjacent bitlines and the effect of capacitive coupling between them
- Figure 13 Yupin Effect
- Figure 14. Cell working points
- Figure 17 Programming Time for 2-bit/cell NAND Flash Memory
- Figure 19 Energy Savings
- Figure 20 3-bit/cell ABL Programming
- List of Tables
- Table 1. ABL vs. Conventional Read Architecture
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